Scanning Electron Microscopy and X-Ray Microanalysis: Third Edition - Joseph Goldstein, Dale E. Newbury, David C. Joy, Charles E. Lyman, Patrick Echlin, Eric Lifshin, Linda Sawyer, J.R. Michael - Google Books

https://books.google.de/books?id=wq7eBwAAQBAJ&pg=PA547#v=onepage

In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The…